• DocumentCode
    1834094
  • Title

    Serial link engineering: A novel jitter/noise metric to qualify channel components

  • Author

    Keshavan, Kumar ; Abou-Jeyab, Tariq

  • Author_Institution
    Sigrity Inc., Santa Clara, CA, USA
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    286
  • Lastpage
    289
  • Abstract
    System interconnects are increasingly dominated by serial links. Understanding the contribution of different system components to jitter and noise, and subsequently tuning those components, is the key to a successful design. In this paper we´re proposing a novel eye-area based normalized jitter and noise metric. We show how this metric can consistently be used for different data rates, to offer insight into various components and to identify the ones that are limiting the design. The study also reveals how seemingly small structures and device parasitics can non-linearly increase their jitter and noise contribution to the overall system.
  • Keywords
    jitter; telecommunication channels; telecommunication network topology; device parasitics; eye-area based normalized jitter; jitter-noise metric; qualify channel components; serial link engineering; system interconnects; Bit error rate; Connectors; Crosstalk; Driver circuits; Impedance; Integrated circuit interconnections; Interference; Jitter; MOS devices; Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284645
  • Filename
    5284645