DocumentCode :
1834287
Title :
A new architecture of signature analyzers for multiple-output circuits
Author :
Matsushima, Tonioko K. ; Matsushima, Toshiyasu ; Hirasawa, Shigeichi
Author_Institution :
Dept. of Inf. Eng., Polytech.. Univ., Sagamihara, Japan
Volume :
4
fYear :
1997
fDate :
12-15 Oct 1997
Firstpage :
3900
Abstract :
The paper presents an architecture for multiple input signature analyzers. The proposed signature analyzer with Hδ inputs is designed by parallelizing a GLFSR(δ,m), where δ is the number of input signals and m is the number of stages in the feedback shift register. The GLFSR, developed by D.K. Pradhan and S. Gupta (1991), is a general framework for representing LFSR based signature analyzers. The parallelization technique described in the paper can be applied to any kind of GLFSR signature analyzer, e.g., SISRs, MISRs, multiple MISRs and MLFSRs. It is shown that a proposed signature analyzer with Hδ inputs requires less complex hardware than either single GLFSR(Hδ,m)s or parallel construction H original GLFSR(δ,m)s. It is also shown that the proposed parallelization technique can be applied to a test pattern generator in BIST, since the GLFSR is also used to generate patterns for a CUT. The proposed technique would be practical for testing CUTs with a large number of input and output sequences, since the test circuit occupies a smaller area on the LSI chip than conventional test circuits
Keywords :
built-in self test; logic analysers; logic circuits; logic testing; shift registers; BIST; CUT; GLFSR signature analyzer; Hδ inputs; LFSR based signature analyzers; LSI chip; MLFSRs; SISRs; circuit under test; feedback shift register; generalised LFSR; input signals; linear feedback shift register; multiple MISRs; multiple input signature analyzers; multiple output circuits; parallel construction H original; parallelization technique; signature analyzers; test circuit; test pattern generator; Automatic testing; Circuit analysis; Circuit faults; Circuit testing; Feedback; Hardware; Large scale integration; Shift registers; Signal analysis; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 1997. Computational Cybernetics and Simulation., 1997 IEEE International Conference on
Conference_Location :
Orlando, FL
ISSN :
1062-922X
Print_ISBN :
0-7803-4053-1
Type :
conf
DOI :
10.1109/ICSMC.1997.633280
Filename :
633280
Link To Document :
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