Multiwall carbon nanotube vias: An effective TL model for EMC oriented analysis

Author

Sarto, M.S. ; Tamburrano, A.

Author_Institution

Dept. of Electr. Eng., Sapienza Univ. of Rome, Rome, Italy

fYear

2009

fDate

17-21 Aug. 2009

Firstpage

97

Lastpage

102

Abstract

The paper presents an effective two-port model of a nano-interconnect constituted by a vertical multiwall carbon nanotube (MWCNT) between two horizontal planes. The new developed model is derived combining the quantum-mechanical effects with the analysis of the EM field radiated from the vertical structure, and can be used to predict the signal integrity of MWCNT vias. EMC oriented analyses are performed in the frequency range up to several tens of gigahertz.

Keywords

carbon nanotubes; electromagnetic compatibility; interconnections; nanotube devices; C; EMC oriented analysis; multiwall carbon nanotube; nanointerconnect; two-port model; vertical structure; vias; Carbon nanotubes; Electromagnetic compatibility; Electromagnetic propagation; Frequency; Integrated circuit interconnections; Nanotechnology; Performance analysis; Predictive models; Signal analysis; Transmission line theory; Nanointerconnect; multiwall carbon nanotube; signal propagation; transmission line; via;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on

Conference_Location

Austin, TX

Print_ISBN

978-1-4244-4266-9

Electronic_ISBN

978-1-4244-4058-0

Type

conf

DOI

10.1109/ISEMC.2009.5284651

Filename

5284651