Title :
Using the Feature Selective Validation technique to compare CEM code predictions and measurements of field distributions for cavity problems
Author :
Drozd, Andrew L. ; Kasperovich, Irina ; Carroll, Clifford E., Jr.
Author_Institution :
ANDRO Comput. Solutions, LLC, Rome, NY, USA
Abstract :
This paper illustrates the application of the feature selective validation (FSV) technique based on the IEEE 1597.1 standard for the validation of CEM computer modeling and simulations. The FSV method facilitates comparisons of sets of electromagnetic (EM) observable data for a given problem to determine a ldquolevel of agreementrdquo measure across any independent variable. This paper compares the results of CEM computer simulations for a cavity problem and a phantom pickup wire used to measure statistical field distributions at various sample points along the length of the wire. The objective of this exercise is to confirm the hypothesis that the field distributions will not vary too significantly along the short wire length. Several different CEM techniques were used, namely finite difference frequency domain (FDTD), multi-level fast multipole (MLFM), and the moment method (MoM). This paper focuses on the results of the FDTD simulations. Future comparisons will be made between the full complement of predictions and a reverberation chamber baseline measurement to establish a level of goodness metric to validate results and demonstrate the efficacy of the FSV approach.
Keywords :
computational electromagnetics; electromagnetic compatibility; finite difference time-domain analysis; method of moments; statistical analysis; CEM code prediction; cavity problem; feature selective validation; finite difference frequency domain; moment method; multilevel fast multipole method; statistical field distribution; Application software; Computational modeling; Computer simulation; Electromagnetic measurements; Finite difference methods; Frequency domain analysis; Imaging phantoms; Length measurement; Time domain analysis; Wire;
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
DOI :
10.1109/ISEMC.2009.5284653