DocumentCode
1834423
Title
Multielemental segregation coefficient of thallium bromide impurities from inductively coupled plasma mass spectroscopy measurements
Author
Mesquita, Carlos H. ; Oliveira, Icimone B. ; Chubaci, José F D ; Hamada, Margarida M.
Volume
5
fYear
2003
fDate
19-25 Oct. 2003
Firstpage
3431
Abstract
Thallium bromide (TlBr) is a compound semiconductor with a high atomic number and wide band gap, being a very promising material to be used as room temperature radiation detectors. The commercial TlBr powder is used for growing crystals for detector applications. To reduce impurities, this material is purified by the zone refining technique. In this work the trace impurities at ppm level were analyzed using ICP-MS, before and after zone refining. The efficiency of the purification was analyzed theoretically from the experimental data of the segregation coefficient estimated. Three impurities were described in this work: lithium (k=0.381), barium (k=0.699) and chromium (k=0.546).
Keywords
X-ray detection; gamma-ray detection; impurities; mass spectra; segregation; semiconductor counters; zone refining; commercial TlBr powder; compound semiconductor; high atomic number; inductively coupled plasma mass spectroscopy; multielemental segregation coefficient; ppm level; room temperature radiation detectors; thalium bromide impurities; trace impurities; wide band gap; zone refining technique; Atomic measurements; Crystalline materials; Mass spectroscopy; Plasma applications; Plasma materials processing; Plasma measurements; Plasma temperature; Semiconductor impurities; Semiconductor materials; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8257-9
Type
conf
DOI
10.1109/NSSMIC.2003.1352650
Filename
1352650
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