Title :
Ultimate low cost analog BIST
Author :
Negreiros, Marcelo ; Carro, Luigi ; Susin, Altamiro Amadeu
Author_Institution :
Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
In this work a BIST method for linear analog circuits with very low cost and the smallest possible analog overhead area is presented. The method is suitable to be implemented in the SoC environment, as it allows the reuse of resources already available in the system, and it is essentially digital. Theoretical background is provided, and experimental results demonstrate the advantages and limits of the proposed approach.
Keywords :
analogue circuits; analogue integrated circuits; built-in self test; integrated circuit economics; system-on-chip; DSP-based analog test; SoC environment; analog BIST; linear analog circuit; Analog circuits; Built-in self-test; Circuit noise; Circuit testing; Costs; Data acquisition; Permission; Signal generators; System testing; Working environment noise;
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Print_ISBN :
1-58113-688-9
DOI :
10.1109/DAC.2003.1219084
