DocumentCode :
1834564
Title :
Coupling of large number of vias in electronic packaging structures and differential signaling
Author :
Houfei Chen ; Qin Li ; Leung Tsang ; Jandhyala, V.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Volume :
2
fYear :
2002
fDate :
2-7 June 2002
Firstpage :
983
Abstract :
A method is presented for modeling the multi-interaction among large numbers of vertical vias in densely packaged integrated circuits. The analysis of the interior problem is based upon a cylindrical wave expansion of the magnetic field Green´s function and the foldy-lax multiple scattering formula. The exterior problem of bent traces is analyzed using the MOM approach. A system matrix equation is obtained by combining the exterior and interior problem, the solution of which gives the propagation characteristics of the entire structure. Using an iterative solver, results are illustrated for problems of several thousand vias with moderate CPU and memory requirements. Also illustrated are the results for common and differential modes in differential signaling, including the effects of surrounding idle vias and shorting vias.
Keywords :
Green´s function methods; conjugate gradient methods; coupled transmission lines; integrated circuit interconnections; integrated circuit modelling; integrated circuit packaging; method of moments; transmission line matrix methods; MOM approach; bent traces; bi-conjugate gradient method; coupled transmission lines; cylindrical wave expansion; densely packaged integrated circuits; differential signaling; electronic packaging structures; foldy-lax multiple scattering formula; interior problem; iterative solver; magnetic field Green function; propagation characteristics; shorting vias; surrounding idle vias; system matrix equation; vertical via coupling; Circuit analysis; Coupling circuits; Electronics packaging; Green´s function methods; Integrated circuit modeling; Integrated circuit packaging; Magnetic analysis; Magnetic fields; Message-oriented middleware; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-7239-5
Type :
conf
DOI :
10.1109/MWSYM.2002.1011794
Filename :
1011794
Link To Document :
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