DocumentCode :
1834621
Title :
Electromagnetic Topology combined with Mode Matching for the electromagnetic field penetration analysis of an aperture backed cavity
Author :
Park, Yoon-Mi ; Lee, Younju ; So, Joonho ; Cheon, Changyul ; Chung, Young-Seek ; Jung, Hyun-Kyo
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
121
Lastpage :
126
Abstract :
In this paper, a new method, based on the combination of electromagnetic topology (EMT) and mode matching (MM), is proposed for the analysis of the electromagnetic field coupling phenomena from an external field to an inner electric system. The proposed method can solve the electromagnetic field coupling in a complex system accurately and requires a short computation time and reduced memory. To verify the validity of this method, an aperture backed cavity model was analyzed and the electric field intensity in the cavity and the induced surface current on the wire were computed. The results were compared with FDTD results.
Keywords :
electromagnetic coupling; electromagnetic wave propagation; topology; FDTD; aperture backed cavity; electric field intensity; electromagnetic field coupling phenomena; electromagnetic field penetration analysis; electromagnetic field propagation path; electromagnetic topology; inner electric system; mode matching; Apertures; Coupling circuits; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic fields; Electromagnetic scattering; Equations; Sparse matrices; Topology; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284664
Filename :
5284664
Link To Document :
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