• DocumentCode
    1834699
  • Title

    Pulse shape analysis for electron mobility study in cadmium zinc telluride gamma-ray detectors

  • Author

    Mengesha, W. ; Aalseth, C.E. ; Barnett, D.S. ; Bliss, M. ; Schaefer, C.

  • Author_Institution
    Pacific Northwest Nat. Lab., Richland, WA, USA
  • Volume
    5
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    3498
  • Abstract
    A pulse shape analysis technique was implemented to determine electron mobility, μe, and electron mobility lifetime product, μeτe in cadmium zinc telluride detectors (CZT). The digital gamma finder, (DGF-4C), a single width CAMAC module produced by X-ray Instrumentation Associates (XIA), was used to extract pulse height, pulse shape, and signal rise time information. Post data acquisition analysis using the extracted information allowed measuring the μe and μeτe, in selected CZT samples. An almost linear relationship was observed for the signal rise time as a function of the inverse bias. This observed linear relationship was the basis for determination of μe using a simple linear fit. The measured signal amplitude was also used to determine μeτe using the Hecht formulation. Repeated measurements carried out confirmed the consistency of the method in determining μe and μeτe.
  • Keywords
    data acquisition; electron mobility; gamma-ray apparatus; gamma-ray detection; pulse shaping; semiconductor counters; CAMAC module; DGF-4C; Hecht formulation; X-ray Instrumentation Associates; cadmium zinc telluride gamma-ray detectors; data acquisition analysis; digital gamma finder; electron mobility; electron mobility lifetime product; pulse height; pulse shape; pulse shape analysis technique; signal amplitude; signal rise time; signal rise time information; CAMAC; Cadmium compounds; Data mining; Electron mobility; Gamma ray detectors; Instruments; Pulse shaping methods; Shape; Space vector pulse width modulation; Zinc compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1352665
  • Filename
    1352665