Dual Six-Port Reflectometer Systems Using Waveguide in the Frequency Range 18-50 GHz

Author

Weil, Claude M. ; Marler, F.Eugene ; Major, James R. ; Weidman, Manly P. ; Russell, David H.

Author_Institution

Electromagnetic Fields Division, National Institute of Standards and Technology, (Formerly National Bureau of Standards) Boulder, CO 80303

Volume

15

fYear

1989

fDate

32660

Firstpage

76

Lastpage

88

Abstract

The development and evaluation of three dual six-port reflectometer systems, that use WR-42, WR-28 and WR-22 waveguide, is discussed; these cover the frequency range 18-50 GHz. The systems are capable of automated or semi-automated operation and will provide complex scattering parameter data for customer waveguide components, as well as effective efficiency data for power sensors. Some representative measurement data are presented that demonstrate that these systems yield results that do not differ significantly from those obtained using older measurement systems. Some discussion of measurement uncertainties is also included.

Keywords

Calibration; Coaxial components; Electromagnetic waveguides; Frequency; Measurement uncertainty; NIST; Planar waveguides; Scattering parameters; Standards development; Waveguide components;

fLanguage

English

Publisher

ieee

Conference_Titel

ARFTG Conference Digest-Spring, 33rd

Conference_Location

Long Beach, CA, USA

Print_ISBN

0-7803-5686-1

Type

conf

DOI

10.1109/ARFTG.1989.323940

Filename

4119506