Title :
Dual Six-Port Reflectometer Systems Using Waveguide in the Frequency Range 18-50 GHz
Author :
Weil, Claude M. ; Marler, F.Eugene ; Major, James R. ; Weidman, Manly P. ; Russell, David H.
Author_Institution :
Electromagnetic Fields Division, National Institute of Standards and Technology, (Formerly National Bureau of Standards) Boulder, CO 80303
Abstract :
The development and evaluation of three dual six-port reflectometer systems, that use WR-42, WR-28 and WR-22 waveguide, is discussed; these cover the frequency range 18-50 GHz. The systems are capable of automated or semi-automated operation and will provide complex scattering parameter data for customer waveguide components, as well as effective efficiency data for power sensors. Some representative measurement data are presented that demonstrate that these systems yield results that do not differ significantly from those obtained using older measurement systems. Some discussion of measurement uncertainties is also included.
Keywords :
Calibration; Coaxial components; Electromagnetic waveguides; Frequency; Measurement uncertainty; NIST; Planar waveguides; Scattering parameters; Standards development; Waveguide components;
Conference_Titel :
ARFTG Conference Digest-Spring, 33rd
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1989.323940