Title :
New VCCI program — Kit module program
Author :
Satake, Shozo ; Shimasaki, Toshiki ; Yamane, Hiroshi
Author_Institution :
VCCI Council, Tokyo, Japan
Abstract :
VCCI Council introduced the kit module program designed to serve as an intermediary between module manufactures and equipment makers using their modules. Magnetit´ Probe Method, one of the IEEE. 61967 test methods, is employed in the program for its simplicity and low implementation cost. An interposer was developed to bridge target memory module and mother board for operation at the real time frequency and aggregation of power supply circuits for measurement with MP method. The result of pilot measurements of DDR2 memory modules is reported.
Keywords :
IEEE standards; electromagnetic interference; electron device testing; DDR2 memory module; IEEE 61967 test method; Magnetit probe method; VCCI program; equipment maker; kit module program; module manufacture; mother board; power supply circuit; real time frequency; Costs; Councils; Current supplies; Electromagnetic interference; Electromagnetic measurements; Frequency; Manufacturing; Noise measurement; Power supplies; Probes;
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
DOI :
10.1109/ISEMC.2009.5284682
