DocumentCode :
1835138
Title :
Sigma delta ADC with a dynamic reference for accurate temperature and voltage sensing
Author :
Saputra, N. ; Pertijs, M.A.P. ; Makinwa, K.A.A. ; Huijsing, J.H.
Author_Institution :
Electron. Res. Lab., Delft Univ. of Technol., Delft
fYear :
2008
fDate :
18-21 May 2008
Firstpage :
1208
Lastpage :
1211
Abstract :
A second-order sigma-delta analog-to-digital converter (ADC) with 12-bit absolute accuracy has been designed using a 0.7 mum CMOS technology. The ADC is part of a temperature sensor, and they both share a dynamic band-gap reference voltage, which is trimmed at room temperature. By using precision techniques such as chopping, correlated double-sampling and dynamic element matching, this reference voltage has a temperature coefficient of 3.5 ppm/degC over the range -40degC to 125degC. Its curvature error is corrected at the system level by means of a look-up-table-driven feedback loop. The result is an accurate temperature sensor with, in addition, accurate voltage sensing capability. The ADC´s input dynamic range extends from 0 to VDD, for VDD ranging from 2.5 V to 5.5 V. The chip has an active area of 4.9 mm2, and a current consumption of 85 muA.
Keywords :
CMOS integrated circuits; choppers (circuits); circuit feedback; electric sensing devices; sigma-delta modulation; table lookup; temperature sensors; voltage measurement; 0.7 mum CMOS technology; analog-digital converter; chopping; correlated double-sampling; current 85 muA; curvature error; dynamic band-gap reference voltage; dynamic element matching; input dynamic range; look-up-table-driven feedback loop; second-order sigma delta ADC; size 0.7 mum; temperature -40 degC to 125 degC; temperature coefficient; temperature sensor; voltage 0 V to 5.5 V; voltage sensing; Analog-digital conversion; CMOS technology; Delta-sigma modulation; Dynamic range; Error correction; Feedback loop; Photonic band gap; Temperature distribution; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4244-1683-7
Electronic_ISBN :
978-1-4244-1684-4
Type :
conf
DOI :
10.1109/ISCAS.2008.4541641
Filename :
4541641
Link To Document :
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