• DocumentCode
    1835172
  • Title

    On-Wafer Microwave Standards at NIST

  • Author

    Williams, Dylan

  • Author_Institution
    National Institute of Standards and Technology, Boulder Colorado
  • Volume
    16
  • fYear
    1989
  • fDate
    Nov. 1989
  • Firstpage
    5
  • Lastpage
    10
  • Abstract
    The National Institute of Standards and Technology has begun a program to develop standards and calibration services for microwave wafer-level probing systems. The standards will be based on planar transmission lines and are designed to support measurements between 1 and 40 GHz. The program objectives, organization, and plans are discussed.
  • Keywords
    Calibration; Conductors; Coplanar waveguides; MMICs; Measurement standards; Microstrip; NIST; Probes; Scattering parameters; Standards development; MMIC; calibration; microwave; scattering parameter; standards; wafer probe;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Winter, 34th
  • Conference_Location
    Ft. Lauderdale, FL, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1989.323951
  • Filename
    4119519
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1835172