DocumentCode :
1835211
Title :
On-chip interconnect-aware design and modeling methodology based on high bandwidth transmission line devices
Author :
Goren, D. ; Zelikson, M. ; Gordin, R. ; Wagner, I.A. ; Barger, A. ; Amir, A. ; Livshitz, B. ; Sherman, A. ; Tretiakov, Y. ; Groves, R. ; Park, Jongho ; Jordan, D. ; Strang, S. ; Singh, R. ; Dickey, C. ; Harame, D.
Author_Institution :
IBM Haifa R&D Labs, Israel
fYear :
2003
fDate :
2-6 June 2003
Firstpage :
724
Lastpage :
727
Abstract :
This paper expands the on-chip interconnect-aware methodology for high-speed analog and mixed signal design, presented in D. Goren et al. (2002), into a wider class of designs, including dense layout CMOS design. The proposed solution employs a set of parameterized on-chip transmission line (T-line) devices for the critical interconnects, which is expanded to include coplanar structures while considering the silicon substrate effect. The generalized methodology contains treatment of the crossing line effects at the various design stages, including two way interactions between the post layout extraction tool and the T-line devices. The T-line device models are passive by construction, easily migratable among design environments, and allow for both time and frequency domain simulations. These models are verified by S-parameter measurements up to 110GHz, as well as by EM solver results. It is experimentally shown that the effect of properly designed discontinuities is negligible in most practical cases. The basic on-chip T-line methodology is being used extensively for numerous high-speed designs.
Keywords :
CMOS integrated circuits; S-parameters; integrated circuit design; integrated circuit interconnections; semiconductor process modelling; EM solver result; S-parameter measurement; T-line device; analog signal; bandwidth transmission line device; coplanar structure; critical interconnect; crossing line effect; dense layout CMOS design; design environment; extraction tool; frequency domain simulation; mixed signal design; modeling methodology; on-chip interconnect-aware design; on-chip transmission line; silicon substrate effect; time domain simulation; Bandwidth; Design methodology; Impedance; Integrated circuit interconnections; Integrated circuit measurements; Permission; Research and development; Signal design; Silicon germanium; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Print_ISBN :
1-58113-688-9
Type :
conf
DOI :
10.1109/DAC.2003.1219114
Filename :
1219114
Link To Document :
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