Title :
A precision CMOS voltage reference with enhanced stability for the application to advanced VLSI´s
Author :
Hoi-Jun Yoo ; Seung-Jun Lee ; Kye-Hwan Oh
Author_Institution :
Hyundai Electronics Inc.
Keywords :
CMOS technology; Circuit noise; Circuit stability; Hot carriers; MOSFETs; Photonic band gap; Random access memory; Temperature; Threshold voltage; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
