• DocumentCode
    1835311
  • Title

    Electromagnetic field immunity test system applying array antenna technology

  • Author

    Uchida, Takeshi ; Miyazaki, Chiharu ; Oka, Naoto ; Misu, Koichiro ; Konishi, Yoshihiko

  • Author_Institution
    Inf. Technol. R&D Center, Mitsubishi Electr. Corp., Kamakura, Japan
  • fYear
    2009
  • fDate
    17-21 Aug. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    We examined about the electromagnetic field immunity test system applying the array antenna technology. This system is able to get the electric field uniformity and the high power electric field near the antenna, in a wideband, by the beam forming technology. We constructed an electromagnetic field immunity test system consisting of 64 elements array antenna as a prototype. In this paper, we calculated the electric field uniformity near electromagnetic field immunity test system. We measured electric distributions and compared with the calculated value and the measured value. From these results, the validity of the calculation method of the electric field uniformity near the test system was confirmed.
  • Keywords
    antenna arrays; array signal processing; broadband antennas; electromagnetic fields; antenna array technology; beam forming technology; electric distribution measurement; electromagnetic field immunity test system; wideband antenna; Antenna arrays; Antenna measurements; Antenna radiation patterns; Broadband antennas; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; High power amplifiers; Slot antennas; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-4266-9
  • Electronic_ISBN
    978-1-4244-4058-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2009.5284694
  • Filename
    5284694