DocumentCode :
1835401
Title :
Randomization Based Probabilistic Approach to Detect Trojan Circuits
Author :
Jha, Somesh ; Jha, Susmit
fYear :
2008
fDate :
3-5 Dec. 2008
Firstpage :
117
Lastpage :
124
Abstract :
In this paper, we propose a randomization based technique to verify whether a manufactured chip conforms to its design or is infected by any trojan circuit. A trojan circuit can be inserted into the design or fabrication mask by a malicious manufacturer such that it monitors for a specific rare trigger condition, and then it produces a payload error in the circuit which alters the functionality of the circuit often causing a catastrophic crash of the system where the chip was being used. Since trojans are activated by rare input patterns, they are stealthy by nature and are difficult to detect through conventional techniques of functional testing. In this paper, we propose a novel randomized approach to probabilistically compare the functionality of the implemented circuit with the design of the circuit. Using hypothesis testing, we provide quantitative guarantees when our algorithm reports that there is no trojan in the implemented circuit. This allows us to trade runtime for accuracy. The technique is sound, that is, it reports presence of a trojan only if the implemented circuit is actually infected. If our algorithm finds that the implemented circuit is infected with a trojan, it also reports a fingerprint input pattern to distinguish the implemented circuit from the design. We illustrate the effectiveness of our technique on a set of infected and benign combinational circuits.
Keywords :
combinational circuits; integrated circuit testing; microprocessor chips; probability; catastrophic crash; combinational circuits; fingerprint input pattern; functional testing; hypothesis testing; manufactured chip; randomization based probabilistic approach; trojan circuits; Algorithm design and analysis; Circuit testing; Combinational circuits; Computer crashes; Fabrication; Fingerprint recognition; Payloads; Pulp manufacturing; Runtime; Vehicle crash testing; Randomized Algorithm; Trojan Circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Assurance Systems Engineering Symposium, 2008. HASE 2008. 11th IEEE
Conference_Location :
Nanjing
ISSN :
1530-2059
Print_ISBN :
978-0-7695-3482-4
Type :
conf
DOI :
10.1109/HASE.2008.37
Filename :
4708870
Link To Document :
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