Title :
A Cost-Effective Production DC/RF On-Wafer GaAs FET Measurement System
Author :
Copeland, Eric S. ; Borg, Matthew ; Kerwin, Kevin J.
Author_Institution :
Hewlett-Packard Company, Santa Rosa, CA
Abstract :
This paper describes a cost-effective DC and microwave test system for production screening of discrete and process-monitor GaAs FETs. Topics covered include system hardware, test software and data storage, DC error-correction, RF GaAs FET modeling, RF probe card technology, error-correction for common-mode inductance, and on-wafer calibration.
Keywords :
Gallium arsenide; Hardware; Memory; Microwave FETs; Probes; Production systems; Radio frequency; Software systems; Software testing; System testing;
Conference_Titel :
ARFTG Conference Digest-Winter, 34th
Conference_Location :
Ft. Lauderdale, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1989.323964
