• DocumentCode
    1835512
  • Title

    Advanced microwave modeling framework exploiting automatic model generation, knowledge neural networks and space mapping

  • Author

    Devabhaktuni, V. ; Chattaraj, B. ; Yagoub, M.C.E. ; Zhang, Q.J.

  • Author_Institution
    Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
  • Volume
    2
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    1097
  • Abstract
    In this paper, we propose an efficient Knowledge based Automatic Model Generation (KAMG) technique, aimed at generating microwave neural models of highest possible accuracy using fewest accurate data. The technique is comprehensively derived to integrate three distinct powerful concepts, namely, automatic model generation, knowledge neural networks and space mapping. We utilize two types of data generators - fine data generators that are accurate and slow (e.g., CPU-intensive 3D-EM simulators); coarse data generators that are approximate and fast (e.g., inexpensive 2D-EM). Motivated by the space-mapping concept, the KAMG utilizes extensive approximate data but fewest accurate data to generate neural models that accurately match fine data. Our formulation exploits a variety of knowledge network architectures to facilitate reinforced neural network learning from both coarse and fine data. During neural model generation by KAMG both coarse and fine data generators are automatically driven using adaptive sampling. The proposed technique is demonstrated through examples of MOSFET, and embedded passives used in multi-layer PCBs.
  • Keywords
    electronic design automation; knowledge based systems; microwave technology; neural nets; 2D-EM simulator; 3D-EM simulator; CAD; KAMG technique; MOSFET; adaptive sampling; automatic model generation; data generator; embedded passive component; knowledge neural network; microwave model; microwave neural model; multilayer PCB; space mapping; Capacitors; Design automation; High power microwave generation; Microwave devices; Microwave generation; Microwave theory and techniques; Neural networks; Sampling methods; Space technology; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1011836
  • Filename
    1011836