Title :
At What Level of Granularity Should We be Componentizing for Software Reliability?
Author :
Mohamed, Atef ; Zulkernine, Mohammad
Author_Institution :
Sch. of Comput., Queen´´s Univ., Kingston, ON
Abstract :
In component-based software systems (CBSSs), software designers need to decide about decomposition level (level of granularity) which involves component sizes and the number of components. In these systems, decomposition level is important due to its major impacts on reliability. However, the basis to choose the decomposition level of a CBSS has not been addressed adequately in the existing research. On the other hand, software system components may vary with respect to their criticalities to different failures. The knowledge about component failure criticalities are currently not incorporated in the architectural design decisions of these systems. As a result, these systems consider different failures equally and disregard the various severities of different failures. In this paper, we study the level of decomposition of CBSSs with respect to its impact on their reliabilities based on various component failure criticalities. We discuss the level of decomposition impacts on CBSS architectures with respect to the architectural attributes and component failure criticalities. We derive the reliability of these systems and show the level of decomposition impacts on these system reliabilities.
Keywords :
object-oriented programming; software architecture; software fault tolerance; software reliability; CBSS architectures; component failure criticalities; component-based software systems; software reliability; software system components; Computer architecture; Multimedia systems; Real time systems; Reliability engineering; Software design; Software reliability; Software systems; Streaming media; Systems engineering and theory; Timing; Componentization; architectural design decisions; component reliability; failure criticalities; level of decomposition;
Conference_Titel :
High Assurance Systems Engineering Symposium, 2008. HASE 2008. 11th IEEE
Conference_Location :
Nanjing
Print_ISBN :
978-0-7695-3482-4
DOI :
10.1109/HASE.2008.14