Title :
Using Embedded Microcontrollers in Radar Test Equipment
Author :
Binney, Richard S. ; Riblett, Loren E.
Author_Institution :
Allied-Signal, Inc., Kansas City Division
Abstract :
With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach.
Keywords :
Circuits; Communication system control; Computer displays; Embedded software; Hardware; Microcontrollers; Monitoring; Radar equipment; Size control; Test equipment;
Conference_Titel :
ARFTG Conference Digest-Spring, 35th
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1990.323978
