Characterization and modeling of the electromagnetic behavior of ICs and packages

Author

Bencivinni, M. ; Camarda, F. ; Capriglione, D. ; Chiariello, A.G. ; Fusillo, G. ; Girardi, A. ; Izzi, R. ; Maffucci, A. ; Martines, I.

Author_Institution

Micron Semicond. Italia S.r.l., Catania, Italy

fYear

2011

fDate

12-16 Sept. 2011

Firstpage

1368

Lastpage

1371

Abstract

This paper analyzes the radiated emissions of a system consisting of an IC (a Flash memory device) and its package (PQFP80). The system is described by means of an IC emission model (ICEM). The radiated emissions are estimated by means of an electromagnetic model for the field emissions of current loops. Experimental characterization was conducted to measure the currents on the package and the far-field emitted fields. The models were experimentally validated and used to analyze case studies for different devices using 150nm and 110nm technologies.

Keywords

electromagnetic compatibility; flash memories; integrated circuit modelling; integrated circuit packaging; IC emission model; PQFP80; electromagnetic behavior; electromagnetic compatibility; far-field emitted fields; field emissions; flash memory device; integrated circuits; quad lflat packs; size 110 nm; size 150 nm; Computational modeling; Current measurement; Electromagnetic compatibility; Flash memory; Frequency measurement; Integrated circuit modeling; Conducting channels; IC emission; ICEM model; Through-Silicon Vias; Transmission line model; vias;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on

Conference_Location

Torino

Print_ISBN

978-1-61284-976-8

Type

conf

DOI

10.1109/ICEAA.2011.6046276

Filename

6046276