Static noise analysis with noise windows

As processing technology scales down to the nanometer regime, capacitive crosstalk is having an increasingly adverse effect on circuit functionality, leading to increasing number of chip failures. In this paper, we propose mapping the static crosstalk functional noise problem into the well understood static timing problem. The key differences between static noise and static timing analyses, namely the injection of noise, accurate noise window propagation and register sensitive window computation are the contributions of this work. We demonstrate the effectiveness of this approach in two industrial designs by achieving 5X reduction in functional noise failures over noise pulse envelope, and 30X reduction in functional noise failures over net based noise failure metrics.