DocumentCode
1836044
Title
Securing Sensor Nodes Against Side Channel Attacks
Author
Pongaliur, Kanthakumar ; Abraham, Zubin ; Liu, Alex X. ; Xiao, Li ; Kempel, Leo
Author_Institution
Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI
fYear
2008
fDate
3-5 Dec. 2008
Firstpage
353
Lastpage
361
Abstract
Side channel attacks are non-invasive attacks in which adversaries gain confidential information by passively observing the target computing device. Sensor nodes are particularly vulnerable to side channel attacks due to the lack of protective physical shielding and their deployment in open environments. As sensor nodes are increasingly being deployed in safety critical applications such as power grid, volcano monitoring, and even military applications, protecting sensor nodes from side channel attacks is critical. However, side channel attacks on sensor nodes have not been investigated in previous work. In this paper, we present a taxonomy of side channel attacks on sensor nodes. For each type of the attacks, we provide guidelines and approaches to thwart the attack. We also propose a new technique, called process obfuscation, which can be used as a countermeasure for a variety of side channel attacks on sensor nodes. Furthermore, to demonstrate the feasibility of side channel attacks, we conducted electromagnetic leakage attacks, a type of side channel attack, on popular Tmote-sky sensor nodes using commercially available equipment.
Keywords
telecommunication security; wireless sensor networks; Tmote-sky sensor nodes; confidential information; electromagnetic leakage attacks; noninvasive attacks; process obfuscation; side channel attacks; Acoustic sensors; Bandwidth; Batteries; Electromagnetic analysis; Image analysis; Information analysis; Intelligent sensors; Military computing; Sensor phenomena and characterization; Wireless sensor networks; Network; Security; Sensor; Side-Channel;
fLanguage
English
Publisher
ieee
Conference_Titel
High Assurance Systems Engineering Symposium, 2008. HASE 2008. 11th IEEE
Conference_Location
Nanjing
ISSN
1530-2059
Print_ISBN
978-0-7695-3482-4
Type
conf
DOI
10.1109/HASE.2008.26
Filename
4708893
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