Title :
Outage probability of selection combiner over exponentially correlated Weibull-gamma fading channels for arbitrary number of branches
Author :
Reddy, Siva T Bhaskar ; Subadar, Rupaban ; Sahu, P.R.
Author_Institution :
Dept. of ECE, IIT Guwahati, Guwahati, India
Abstract :
Outage probability of a selection combiner (SC) receiver is analyzed over exponentially correlated composite Weibull-gamma fading channels. An expression for the joint probability density function (PDF) of multivariate, exponentially correlated Weibull-gamma distributed random variable is obtained. Using this joint PDF, we derive an expression for the outage probability of a SC receiver with arbitrary number of input branches. Obtained expressions are numerically evaluated and the effect of fading parameters, correlation coefficient and diversity order on the outage are studied.
Keywords :
Weibull distribution; correlation methods; diversity reception; exponential distribution; fading channels; gamma distribution; probability; radio receivers; random processes; SC receiver; correlation coefficient; distributed random variable; exponentially correlated composite Weibull-gamma fading channel; fading parameter; joint PDF; outage probability; probability density function; selection combiner receiver; Diversity reception; Nakagami distribution; Performance analysis; Power system modeling; Probability density function; Random variables; Rayleigh channels; Shadow mapping; Weibull fading channels; Wireless communication; Weibull-gamma distribution; exponential correlation; joint moments; multivariate random variable; outage probability; selection combiner receiver;
Conference_Titel :
Communications (NCC), 2010 National Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4244-6383-1
DOI :
10.1109/NCC.2010.5430213
