Title :
An Integrated Model to Analyze Cryptographic Protocols with Colored Petri Nets
Author :
Wei, Jin ; Su, Guiping ; Xu, Meng
Author_Institution :
Sch. of Inf. Sci. & Eng., Grad. Univ. of Chinese Acad. of Sci., Beijing
Abstract :
Nowadays, DoS-resistant property has become more and more valuable for designing a cryptographic protocol. In this paper, we concentrate on the suitability of applying CPN Tools to merging Devel-Yao model into Meadows´ cost-based framework in the formal analysis of security protocol. Based on Meadows´ framework, we propose a formal model for JFK protocol with Colored Petri Nets. Moreover, we add the powerful intruder process followed with Devel-Yao model into the cost-based model developed earlier, and get a new integrated model, which could be formally analyzed with the simulation approach provided by CPN Tools, successfully verifying not only the DoS-resistant property by comparing the computational costs of initiator and responder in JFK, but also some security properties of JFK such as privacy, authentication.
Keywords :
Petri nets; cryptographic protocols; Devel-Yao model; DoS-resistant property; colored Petri nets; cost-based model; cryptographic protocols; formal analysis; formal model; intruder process; just fast keying protocol; security protocol; Computer crime; Costs; Cryptographic protocols; Design engineering; Information analysis; Information security; Petri nets; Privacy; Protection; Systems engineering and theory; Colored Petri nets; Cost-based Framework; Just Fast Keying protocol (JFK);
Conference_Titel :
High Assurance Systems Engineering Symposium, 2008. HASE 2008. 11th IEEE
Conference_Location :
Nanjing
Print_ISBN :
978-0-7695-3482-4
DOI :
10.1109/HASE.2008.23