Title :
Error ratio model for synchronised-OOK IR-UWB receivers in AWGN channels
Author :
Crepaldi, Marco ; Kinget, Peter R.
Author_Institution :
Ist. Italiano di Tecnol. at Polito-CSHR, Italy
Abstract :
Synchronised On/Off keying (S-OOK) is a pulse modulation format where timing synchronisation pulses are embedded with each bit in the data stream resulting in a 1.5 pulse/bit format, but allowing for synchronisation and demodulation with a single block. In this reported work, the error ratio for S-OOK symbols received in a non-fading AWGN channel is analysed and a mathematical model aware of the physical parameters of a CMOS integrated prototype is introduced. Using this model, the S-OOK RX sensitivity is shown to be close to that of a high-threshold OOK RX for similar error-ratios but assuming perfect synchronisation.
Keywords :
AWGN channels; CMOS integrated circuits; amplitude shift keying; demodulation; synchronisation; ultra wideband communication; CMOS integrated prototype; S-OOK RX sensitivity; S-OOK symbols; demodulation; error ratio model; high-threshold OOK RX; mathematical model; nonfading AWGN channel; pulse modulation format; synchronised on-off keying; synchronised-OOK IR-UWB receivers; timing synchronisation pulses;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2012.3607