• DocumentCode
    1836623
  • Title

    DC testing of analog integrated circuits with piecewise linear approximation and interval analysis

  • Author

    Leenaerts, Domine M. W.

  • Author_Institution
    Technical University of Eindhoven
  • fYear
    1993
  • fDate
    3-6 May 1993
  • Firstpage
    1337
  • Lastpage
    1340
  • Keywords
    Analog circuits; Analog integrated circuits; Automatic testing; Circuit faults; Circuit testing; Distortion measurement; Integrated circuit testing; Performance evaluation; Phase measurement; Piecewise linear approximation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Conference_Location
    IEEE
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • Filename
    692901
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1836623