Title :
DC testing of analog integrated circuits with piecewise linear approximation and interval analysis
Author :
Leenaerts, Domine M. W.
Author_Institution :
Technical University of Eindhoven
Keywords :
Analog circuits; Analog integrated circuits; Automatic testing; Circuit faults; Circuit testing; Distortion measurement; Integrated circuit testing; Performance evaluation; Phase measurement; Piecewise linear approximation;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
