• DocumentCode
    1836624
  • Title

    Thermal management of silicon-based multichip modules

  • Author

    Mok, Lawrence S.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1994
  • fDate
    1-3 Feb 1994
  • Firstpage
    59
  • Lastpage
    63
  • Abstract
    Thermal characteristics of silicon-based multichip modules and their associated heat sinks are presented. The structure of the multichip modules allows the heat generated inside a chip to be conducted away to the heat sink through the solder balls between the chips and the silicon substrate. The internal thermal resistances thus depend on the number of solder balls as well as the number of layers of insulators on the chip and the substrate. A thermal test module which has dimensions 59×59 mm mounted with nine thermal chips has been tested. The module can dissipate about 43 W at a chip temperature rise of 60°C when a heat sink with fin height of 25 mm is used at 1 m/s airflow. The heat sink has seven doubly folded fins which are thermally optimized to give the best cooling performance while keeping the lowest pressure drop across the heat sink at a given airflow rate
  • Keywords
    cooling; flip-chip devices; heat sinks; multichip modules; silicon; temperature distribution; thermal resistance; 25 mm; 43 W; Si; Si substrate; Si-based multichip modules; chip temperature rise; cooling performance; doubly folded fins; fin height; flip-chip bonding technology; heat sinks; internal thermal resistance; power dissipation; pressure drop; solder balls; thermal interface materials; thermal management; thermal optimization; thermal test module; Bonding; Circuits; Cooling; Heat sinks; Multichip modules; Silicon; Substrates; Testing; Thermal management; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 1994. SEMI-THERM X., Proceedings of 1994 IEEE/CPMT 10th
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-1852-8
  • Type

    conf

  • DOI
    10.1109/STHERM.1994.288993
  • Filename
    288993