DocumentCode :
1836624
Title :
Thermal management of silicon-based multichip modules
Author :
Mok, Lawrence S.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
1994
fDate :
1-3 Feb 1994
Firstpage :
59
Lastpage :
63
Abstract :
Thermal characteristics of silicon-based multichip modules and their associated heat sinks are presented. The structure of the multichip modules allows the heat generated inside a chip to be conducted away to the heat sink through the solder balls between the chips and the silicon substrate. The internal thermal resistances thus depend on the number of solder balls as well as the number of layers of insulators on the chip and the substrate. A thermal test module which has dimensions 59×59 mm mounted with nine thermal chips has been tested. The module can dissipate about 43 W at a chip temperature rise of 60°C when a heat sink with fin height of 25 mm is used at 1 m/s airflow. The heat sink has seven doubly folded fins which are thermally optimized to give the best cooling performance while keeping the lowest pressure drop across the heat sink at a given airflow rate
Keywords :
cooling; flip-chip devices; heat sinks; multichip modules; silicon; temperature distribution; thermal resistance; 25 mm; 43 W; Si; Si substrate; Si-based multichip modules; chip temperature rise; cooling performance; doubly folded fins; fin height; flip-chip bonding technology; heat sinks; internal thermal resistance; power dissipation; pressure drop; solder balls; thermal interface materials; thermal management; thermal optimization; thermal test module; Bonding; Circuits; Cooling; Heat sinks; Multichip modules; Silicon; Substrates; Testing; Thermal management; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1994. SEMI-THERM X., Proceedings of 1994 IEEE/CPMT 10th
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-1852-8
Type :
conf
DOI :
10.1109/STHERM.1994.288993
Filename :
288993
Link To Document :
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