DocumentCode
1836795
Title
Estimation of radar cross section in multiple reflection ducts by combination of modified-physical optics and Iterative Physical Optics
Author
Hasaba, Ryosuke ; Ito, Keita ; Ando, Makoto
Author_Institution
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo, Japan
fYear
2011
fDate
22-25 May 2011
Firstpage
380
Lastpage
383
Abstract
Recently, it is necessary to compute electromagnetic scattering at the high-frequencies In this paper, we analyze electrical fields reflected from concave surface scatterer by using the hybrid method. One of the hybrid method for a convex surface is Modified-Vector Physical Optics (MPO) which enhances the accuracy of Physical Optics (IPO) as high-frequency approximation. The other for a concave surface having multiple-reflections, is Iterative Physical Optics which consists in an iterative resolution of wave source to compute the currents on the inner walls of the cavity. We use each of them independently and describe the external scattering by equivalence theorem. We compute the scattered fields by using the hybrid method. We estimate the accuracy of them by use of radar cross section (RCS).
Keywords
electromagnetic wave reflection; electromagnetic wave scattering; iterative methods; physical optics; radar cross-sections; IPO; MPO; RCS; cavity inner walls; concave surface scatterer; convex surface; electrical fields; electromagnetic scattering; equivalence theorem; external scattering; high-frequency approximation; hybrid method; iterative physical optics; iterative resolution; modified-physical optics; modified-vector physical optics; multiple reflection ducts; multiple-reflections; radar cross section estimation; scattered fields; wave source; Apertures; Cavity resonators; Ducts; Moment methods; Physical optics; Radar cross section; Iterative Physical Optics; Modified Physical Optics; Multiple Reflections; Radar Cross Section;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Technology & Computational Electromagnetics (ICMTCE), 2011 IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-8556-7
Type
conf
DOI
10.1109/ICMTCE.2011.5915538
Filename
5915538
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