• DocumentCode
    1836877
  • Title

    A Resonant Mode Dielectrometer for Substrates

  • Author

    Kent, Gordon

  • Author_Institution
    Dielectric Laboratories & GDK Products
  • Volume
    19
  • fYear
    1991
  • fDate
    13-14 June 1991
  • Firstpage
    21
  • Lastpage
    25
  • Abstract
    An advance towards meeting the need for microwave permittivity measurements of substrates is represented by the resonant mde dielectrmter (RMD), Fig.lb. The RMD is an evolution frun the evanescent mde dielectrmter (EMD), which is related to other evanescent resonators. These methods use the lowest resonance of the TE-01 cylindrical waveguide mode; and as a result, no metalization of the specimen is required. Only the EMD and RMi) are suitable for measuring thin sanples of any shape but large enough in area.
  • Keywords
    Area measurement; Cutoff frequency; Dielectric constant; Dielectric substrates; Distortion measurement; Laboratories; Permittivity measurement; Resonance; Resonant frequency; Shape measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 37th
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1991.324016
  • Filename
    4119590
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1836877