Title :
A Resonant Mode Dielectrometer for Substrates
Author_Institution :
Dielectric Laboratories & GDK Products
Abstract :
An advance towards meeting the need for microwave permittivity measurements of substrates is represented by the resonant mde dielectrmter (RMD), Fig.lb. The RMD is an evolution frun the evanescent mde dielectrmter (EMD), which is related to other evanescent resonators. These methods use the lowest resonance of the TE-01 cylindrical waveguide mode; and as a result, no metalization of the specimen is required. Only the EMD and RMi) are suitable for measuring thin sanples of any shape but large enough in area.
Keywords :
Area measurement; Cutoff frequency; Dielectric constant; Dielectric substrates; Distortion measurement; Laboratories; Permittivity measurement; Resonance; Resonant frequency; Shape measurement;
Conference_Titel :
ARFTG Conference Digest-Spring, 37th
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1991.324016
