Title :
On-chip tests for gain bandwidth product and slew rate
Author :
Kenney, John G. ; Ramamurthy, Karthikeyan
Author_Institution :
Oregon State University
Keywords :
Analog circuits; Bandwidth; Circuit testing; Gain measurement; Integrated circuit measurements; Integrated circuit testing; Logic testing; Operational amplifiers; Output feedback; Voltage;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
