• DocumentCode
    1836977
  • Title

    Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners

  • Author

    Tutt, Marcel N. ; Pavlidis, Dimitris ; Tsironis, Christos

  • Author_Institution
    Solid-state Electronics Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122
  • Volume
    19
  • fYear
    1991
  • fDate
    33390
  • Firstpage
    66
  • Lastpage
    75
  • Abstract
    A wafer probing system capable of both noise, and load and source pull measurements is described. The system is based on precision computer controlled electromechanical tuners. Sophisticated system software controls calibration, measurements, data analysis and display. Results of measurements of submicron In-GaAs/InAlAs/InP HEMTs and GaAs MESFETs are presented.
  • Keywords
    Automatic control; Calibration; Computer displays; Control systems; Data analysis; Indium compounds; Noise measurement; Software measurement; System software; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Spring, 37th
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1991.324021
  • Filename
    4119595
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1836977