DocumentCode :
183723
Title :
A true-RMS integrated power sensor for on-chip calibration
Author :
Wursthorn, Jonas ; Knapp, Herbert ; Aufinger, Klaus ; Lachner, Rudolf ; Al-Eryani, Jidan ; Maurer, Linus
Author_Institution :
Infineon Technol. AG, Neubiberg, Germany
fYear :
2014
fDate :
Sept. 28 2014-Oct. 1 2014
Firstpage :
13
Lastpage :
16
Abstract :
An on-chip RF power sensor based on the bolometer principle is presented in this work. The sensor can be used for transmitter calibration purposes without using any RF equipment offering time and cost savings. Investigations on various layers of the fT=170GHz SiGe bipolar technology, which is used in this work, are performed and evaluated. Especially silicided polysilicon layers show a promising behavior as bolometer. Measurements on a 76GHz transmitter chip are performed to point out the feasibility of the on-chip absolute RF power sensor. The results show that this novel sensor concept is well suited for on-chip self-calibration.
Keywords :
Ge-Si alloys; bolometers; radiofrequency integrated circuits; SiGe; SiGe bipolar technology; bolometer principle; frequency 170 GHz; frequency 76 GHz; on-chip RF power sensor; on-chip calibration; on-chip self-calibration; silicided polysilicon layers; transmitter calibration; transmitter chip; true-RMS integrated power sensor; Calibration; Detectors; Power measurement; Radio frequency; Resistance; Resistors; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE
Conference_Location :
Coronado, CA
Type :
conf
DOI :
10.1109/BCTM.2014.6981276
Filename :
6981276
Link To Document :
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