DocumentCode :
1837356
Title :
On-Wafer Millimeter-Wave Nework Analysis for Device and Circuit Design
Author :
Tabuchi, James ; Hughes, Brian ; Perdomo, Julio
Author_Institution :
Hewlett-Packard Company, Network Measurements Division, Microwave Technology Division, Santa Rosa, CA 95403
Volume :
20
fYear :
1991
fDate :
Dec. 1991
Firstpage :
53
Lastpage :
61
Abstract :
A broadband, millimeter-wave on-wafer network analyzer system is necessary for the characterization and design of millimeter-wave devices and circuits. The HP 85109B, 45 MHz to 62.5 GHz, network analyzer system is used to determine the fT, fmax and model parameters of a 0.25 micron MODFET. The system is also used to measure the cutoff frequency and the potential for out-of-band oscillations of a broadband 0.5 to 50 GHz travelling wave amplifier[1]. A criteria is established for the selection of a broadband millimeter-wave network analyzer. Finally, results are demonstrated in measuring devices on-wafer in V-Band (50 to 75 GHz).
Keywords :
Bandwidth; Calibration; Circuit synthesis; Frequency measurement; MODFET circuits; Microwave technology; Millimeter wave circuits; Millimeter wave measurements; Probes; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Winter, 38th
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1991.324038
Filename :
4119614
Link To Document :
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