Title :
High-resolution imaging of domain walls under the influence of spin currents
Author :
Allenspach, R. ; Eib, P. ; Schwarz, F. ; Bischof, A.
Author_Institution :
IBM Res. - Zurich, Rüschlikon, Switzerland
Abstract :
Spin-polarized scanning electron microscopy (spin-SEM, or SEMPA) is used to image the magnetic domain walls in nanoscale elements with a lateral resolution of 20 nm. Here it is illustrated how geometry and external excitation by spin currents influence and modify the domain wall structure.
Keywords :
image resolution; magnetic domain walls; scanning electron microscopy; SEMPA; high-resolution imaging; magnetic domain wall structure; nanoscale elements; size 20 nm; spin currents; spin-SEM; spin-polarized scanning electron microscopy; Iron; Magnetic domain walls; Magnetic force microscopy; Magnetization; Scanning electron microscopy; Wires;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-61284-976-8
DOI :
10.1109/ICEAA.2011.6046339
