Title :
Reciprocity Relations for On-Wafer Power Measurement
Author :
Marks, Roger B. ; Williams, Dylan F.
Author_Institution :
National Institute of Standards and Technology, 325 Broadway Boulder, CO 80303
Abstract :
The implications of expressions relating the forward and reverse transmission coefficients of a waveguide junction derived from the Lorentz reciprocity condition are explored. The two terms in the relation, the phase of the reference impedance in the guide and a new reciprocity factor, lead to an asymmetric scattering parameter matrix when one of the transmission lines connected to the junction is lossy.
Keywords :
Coaxial components; Dielectric losses; Frequency; Impedance; NIST; Power measurement; Scattering parameters; Transmission line matrix methods; Waveguide components; Waveguide junctions;
Conference_Titel :
ARFTG Conference Digest-Winter, 38th
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1991.324041
