• DocumentCode
    1837409
  • Title

    Reciprocity Relations for On-Wafer Power Measurement

  • Author

    Marks, Roger B. ; Williams, Dylan F.

  • Author_Institution
    National Institute of Standards and Technology, 325 Broadway Boulder, CO 80303
  • Volume
    20
  • fYear
    1991
  • fDate
    Dec. 1991
  • Firstpage
    82
  • Lastpage
    89
  • Abstract
    The implications of expressions relating the forward and reverse transmission coefficients of a waveguide junction derived from the Lorentz reciprocity condition are explored. The two terms in the relation, the phase of the reference impedance in the guide and a new reciprocity factor, lead to an asymmetric scattering parameter matrix when one of the transmission lines connected to the junction is lossy.
  • Keywords
    Coaxial components; Dielectric losses; Frequency; Impedance; NIST; Power measurement; Scattering parameters; Transmission line matrix methods; Waveguide components; Waveguide junctions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Winter, 38th
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1991.324041
  • Filename
    4119617
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1837409