DocumentCode :
1837488
Title :
Intelligent chatter detection based on wavelet packet node energy and LSSVM-RFE
Author :
Shicai Qian ; Yuxin Sun ; Zhenhua Xiong
Author_Institution :
Sch. of Mech. Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2015
fDate :
7-11 July 2015
Firstpage :
1514
Lastpage :
1519
Abstract :
Chatter is an unstable phenomenon in machining processes which brings many detrimental effects to cutting tool and workpiece. This paper proposes an intelligent chatter detection method which is based on wavelet packet node energy (WPNE), least squares support vector machine based recursive feature elimination (LSSVM-RFE) and least squares support vector machine (LSSVM). The method consists of three steps. First, feature vectors, with high resolution of energy distribution, are constructed by the sixth level WPNE instead of the third level WPNE to acquire more information of machining processes. Second, a feature selection method, LSSVM-RFE, is presented to select the most outstanding features from the original feature set. Finally, the most outstanding features are fed into LSSVM to detect chatter. Turning experiments are conducted to verify the effectiveness and reliability of the proposed approach. Moreover, the effectiveness of the sixth level WPNE and LSSVM-RFE are also demonstrated by the experimental results.
Keywords :
acoustic noise; cutting tools; feature selection; least squares approximations; mechanical engineering computing; signal detection; support vector machines; turning (machining); vibrations; wavelet transforms; LSSVM-RFE; WPNE; cutting tool; energy distribution; feature selection method; feature vectors; intelligent chatter detection; least squares support vector machine based recursive feature elimination; machining processes; turning experiments; wavelet packet node energy; workpiece; Accuracy; Cost function; Feature extraction; Force; Support vector machines; Turning; Wavelet packets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Intelligent Mechatronics (AIM), 2015 IEEE International Conference on
Conference_Location :
Busan
Type :
conf
DOI :
10.1109/AIM.2015.7222756
Filename :
7222756
Link To Document :
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