Title :
Accuracy Improvements to On-Wafer Amplifier Noise Figure Measurements
Author :
Woodin, C.E. ; Wandrei, D.L. ; Adamian, V.
Author_Institution :
ATN Microwave inc. Billerica, Massachusetts
Abstract :
It has been demonstrated that typical scalar and vector measurement systems are not sufficient to characterize the 50 ohm noise figure of low noise amplifiers, where the tolerance for ripple in the measurement is much stricter due the application. Two methods have been presented which rectify the problem and provide similar or reduced measurement time to existing methods.
Keywords :
Calibration; Gain measurement; Impedance; Loss measurement; Low-noise amplifiers; MMICs; Noise figure; Noise measurement; Probes; Software measurement;
Conference_Titel :
ARFTG Conference Digest-Winter, 38th
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1991.324046
