On-wafer Testing Issues for the 90´s and Beyond

The panel session had a theme "On-wafer Testing Issues for the 90\´s and Beyond." member on what they feel are some of the most important on-wafer testing issues that remain, and what solution approaches they andlor their company may be involved with. We try to look into the future and predict on-wafer testing issues and methods that we will be facing through the turn of the century. explore just how mature on-wafer testing is (now that sessions have been devoted to the subject), and to identify key problem areas that conference attendees may want to consider addressing in their own future work.