Title :
A differential SiGe power amplifier using through-silicon-via and envelope-tracking for broadband wireless applications
Author :
Tsay, J. ; Sapp, Matthew ; Phamvu, Michael ; Hall, T. ; Geries, Ryan ; Yan Li ; Lopez, J. ; Lie, D.Y.C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
fDate :
Sept. 28 2014-Oct. 1 2014
Abstract :
In this paper, a differential SiGe power amplifier (PA) is designed using a bipolar differential pair in a 0.35-μm SiGe BiCMOS technology with through-silicon-via (TSV). Measured using continuous wave (CW) and Long Term Evolution (LTE) modulated waveforms, significant gain expansion (3-5 dB) is observed. The PA reaches power-added-efficiency (PAE) of 61.7% / 51.2% / 40.0% at Pout = 25.6 / 25.4 / 25.7 dBm at supply voltages of Vcc = 2.8V / 3.3V / 4.2V, respectively, with 800 MHz CW input. With the help of the envelope-tracking (ET) technique, the measured PAE improves by 7.3% / 10.4% / 15.4% compared to the fixed supply PA at power back-off regions at Pout = 19.9 / 22.1 / 22.4 dBm, achieving PAE of 38.4% / 43.4% / 38.6% at 800 MHz for LTE 16QAM 5 MHz and passing the LTE spectrum emission mask (SEM) without predistortion. This SiGe ET-PA shows promise for operation as the medium power (MP) PA for efficiency enhancement in the back-off regions.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; Long Term Evolution; differential amplifiers; radiofrequency power amplifiers; three-dimensional integrated circuits; LTE modulated waveforms; LTE spectrum emission mask; PAE; SEM; SiGe; SiGe BiCMOS technology; TSV; bipolar differential pair; broadband wireless applications; differential SiGe power amplifier; envelope-tracking technique; frequency 800 MHz; long term evolution modulated waveforms; power-added-efficiency; size 0.35 mum; through-silicon-via; BiCMOS integrated circuits; Gain; Gain measurement; Long Term Evolution; Radio frequency; Silicon germanium; Through-silicon vias; ET-PA; LTE; SiGe power amplifier (PA); envelope modulator (EM); envelope tracking (ET);
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE
Conference_Location :
Coronado, CA
DOI :
10.1109/BCTM.2014.6981302