Current total ionizing dose results and displacement damage results for candidate spacecraft electronics for NASA

Author

Cochran, Donna J. ; Buchner, Stephen P. ; Irwin, Tim L. ; Kniffin, Scott D. ; Ladbury, Raymond L. ; Palor, Christopher D. ; LaBel, Kenneth A. ; Marshall, Cheryl J. ; Reed, Robert A. ; Sanders, Anthony B. ; Hawkins, Donald K. ; Flanigan, Ryan J. ; Cox, Ste

Author_Institution

NASA Goddard Space Flight Center, Greenbelt, MD, USA

fYear

2004

fDate

22-22 July 2004

Firstpage

19

Lastpage

25

Abstract

We present data on the vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage. Devices tested include optoelectronics, digital, analog, linear bipolar devices, hybrid devices, analog-to-digital converters (ADCs), and digital-to-analog converters (DACs), among others.

Keywords

integrated circuit testing; proton effects; semiconductor device testing; space vehicle electronics; ADC; DAC; TID; analog IC; analog-to-digital converters; digital IC; digital-to-analog converters; displacement damage; hybrid devices; linear bipolar devices; optoelectronics; proton damage testing; spacecraft electronics radiation vulnerability; total ionizing dose; Aerospace electronics; Cyclotrons; NASA; Performance evaluation; Protons; Radiation effects; Space vehicles; Test facilities; Testing; USA Councils;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2004 IEEE

Conference_Location

Atlanta, GA, USA

Print_ISBN

0-7803-8697-3

Type

conf

DOI

10.1109/REDW.2004.1352898

Filename

1352898