• DocumentCode
    1838021
  • Title

    “The flipped voltage follower”-based low voltage fully differential CMOS sample-and-hold circuit

  • Author

    Fayomi, Christian Jesus B ; Wirth, Gilson I. ; Ramirez-Angulo, Jamine ; Matsuzawa, Akira

  • Author_Institution
    Comp. Sc. Dept, UQAM, Montreal, QC
  • fYear
    2008
  • fDate
    18-21 May 2008
  • Firstpage
    1716
  • Lastpage
    1719
  • Abstract
    This paper presents the design and preliminary results of a full differential sample-and-hold circuit based on the "flipped voltage follower" (FVF) cell. The heart of this circuit is a fully differential low-voltage OTA based on FVF technique. The use of the FVF reduces the supply power requirements in the OTA. To overcome input sampling switches limitation imposed by the low supply voltage we make use of a low-voltage low stress and reliable clock signal doubler. It is evidenced how different versions of theses cells, coined as "flipped voltage follower (FVF)" and voltage doubler have been used in the past for many applications preliminary simulation results in a 0.18 mum digital CMOS process show that a resolution greater than 8 bits can be obtained with a 1.0 V supply voltage using a 1 MHz clock signal. Further investigations on the performance limit of the proposed method as well as reliability concerns will be performed on the experimental test chip.
  • Keywords
    CMOS digital integrated circuits; circuit reliability; differential amplifiers; network synthesis; operational amplifiers; sample and hold circuits; switching circuits; clock signal; digital CMOS process; flipped voltage follower; frequency 1 MHz; low voltage fully differential integrated circuit; sample-and-hold circuit; size 0.18 mum; voltage 1 V; voltage doubler; CMOS process; Circuits; Clocks; Heart; Low voltage; Power supplies; Sampling methods; Signal resolution; Stress; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-1683-7
  • Electronic_ISBN
    978-1-4244-1684-4
  • Type

    conf

  • DOI
    10.1109/ISCAS.2008.4541768
  • Filename
    4541768