Title :
Test results of total ionizing dose conducted at the Jet Propulsion Laboratory [bipolar and CMOS ICs]
Author :
Rivas, Rosa M. ; Johnston, Allan H. ; Miyahira, Tetsuo F. ; Rax, Bernard G. ; Wiedeman, Michael D.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
This paper reports recent total ionizing dose (TID) test results obtained at JPL. Several device samples were analyzed exhibiting significant failure levels and enhanced low dose rate sensitivity (ELDRS) effects under biased and unbiased conditions.
Keywords :
CMOS integrated circuits; bipolar integrated circuits; gamma-ray effects; integrated circuit testing; CMOS IC; ELDRS effects; HDL; LDL; TID testing; biased conditions; bipolar IC; enhanced low dose rate sensitivity; failure levels; gamma ray tests; high dose level; low dose level; total ionizing dose; unbiased conditions; Automatic testing; Laboratories; Manufacturing; Performance evaluation; Propulsion; Space technology; System testing; Telephony; Temperature measurement; Temperature sensors;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352901
