DocumentCode :
1838102
Title :
Universal architecture to improve equipment maintenance work
Author :
Imai, Akihiko ; Miyamoto, Ryousuke ; Ozawa, Katsutoshi
Author_Institution :
Yasu Semicond. Corp., Shiga, Japan
fYear :
2001
fDate :
2001
Firstpage :
55
Lastpage :
58
Abstract :
This paper introduces a way to build a system that supports maintenance work in the most suitable and efficient way for future semiconductor factories with changing technologies. This system not only has improved the working efficiency of a maintenance section greatly, but practical use of the proposed system attained a greater rate of equipment availability, and improvement in maintenance costs. For future growth of the semiconductor industry, greater cooperation between the semiconductor manufacturer, components maker, and equipment maker will be indispensable. We wish to promote cooperation for improvement in the equipment operation rate, including the formation of data sharing schemes using Internet technology and an intranet between semiconductor manufacturer, equipment maker, and material supplier, and common analysis, and the practical use of existing data for a new line with the assistance of this system
Keywords :
electronic data interchange; fault diagnosis; integrated circuit measurement; integrated circuit yield; internetworking; maintenance engineering; manufacturing resources planning; production engineering computing; Internet technology; components maker; data sharing; equipment availability; equipment maintenance cost; equipment maintenance work; equipment operation; intranet; maintenance section working efficiency; maintenance work support system; material supplier; semiconductor equipment maker; semiconductor factories; semiconductor industry; semiconductor manufacture; semiconductor technologies; universal architecture; Costs; Engineering management; Internet; Lead compounds; Manufacturing industries; Manufacturing processes; Process control; Production facilities; Semiconductor device manufacture; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Symposium, 2001 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-6731-6
Type :
conf
DOI :
10.1109/ISSM.2001.962913
Filename :
962913
Link To Document :
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