DocumentCode :
1838106
Title :
A High Speed Eye Tracking System with Robust Pupil Center Estimation Algorithm
Author :
Xindian Long ; Tonguz, O.K. ; Kiderman, A.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh
fYear :
2007
fDate :
22-26 Aug. 2007
Firstpage :
3331
Lastpage :
3334
Abstract :
This paper presents a new high-speed head- mounted binocular eye position measurement system using infrared lighting and image processing technology. Current eye tracking systems either run on-line at a lower speed, do the processing off-line, or use dedicated hardware to reach high on-line processing rates. The eye position measurement system we developed only uses a general-purpose computing system and off-the-shelf imaging devices. The binocular system can provide on-line horizontal and vertical measurement at a speed of 150 Hz on a desktop system with a 3 GHz Pentium processor. We report a novel dual-mode software system and a two-step processing algorithm to increase the processing rate. A symmetric mass center algorithm is designed to provide more accurate measurements when the pupil area is partially occluded. Using synthetic eye images, we show that our algorithm performs consistently better than some of the widely used algorithms in industry.
Keywords :
eye; medical computing; medical image processing; position measurement; binocular system; head-mounted binocular eye position measurement; high speed eye tracking system; image processing; infrared lighting; robust pupil center estimation algorithm; Algorithm design and analysis; Hardware; Image processing; Infrared imaging; Optical imaging; Position measurement; Robustness; Software algorithms; Software systems; Velocity measurement; Algorithms; Equipment Design; Equipment Failure Analysis; Eye Movements; Humans; Image Interpretation, Computer-Assisted; Ophthalmoscopes; Ophthalmoscopy; Pupil; Reproducibility of Results; Sensitivity and Specificity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
ISSN :
1557-170X
Print_ISBN :
978-1-4244-0787-3
Type :
conf
DOI :
10.1109/IEMBS.2007.4353043
Filename :
4353043
Link To Document :
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