• DocumentCode
    1838112
  • Title

    Coplanar Versus Microstrip Measurements of Millimetre-Wave Devices

  • Author

    Walters, Peter C. ; Pollard, Roger D. ; Richardson, John R. ; Gamand, Patrice M. ; Suchet, Philippe R.

  • Author_Institution
    Dept. of Electronic and Electrical Engineering, Microwave Solid State Group, The University of Leeds, ENGLAND
  • Volume
    22
  • fYear
    1992
  • fDate
    Dec. 1992
  • Firstpage
    26
  • Lastpage
    32
  • Abstract
    The purpose of this paper is to identify the differences between millimetre-wave small-signal scattering parameter device measurements on-wafer in coplanar and microstrip test formats. Calibration in coplanar and microstrip is examined to determine the measurement reference planes and possible calibration problems in the millimetre-wave frequency range. Different device model reference planes are considered.
  • Keywords
    Automatic control; Automatic testing; Calibration; Electromagnetic measurements; Electromagnetic modeling; Microstrip; Microwave devices; Microwave measurements; Parameter extraction; Probes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest-Fall, 40th
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-5686-1
  • Type

    conf

  • DOI
    10.1109/ARFTG.1992.326996
  • Filename
    4119654
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1838112