Title :
Coplanar Versus Microstrip Measurements of Millimetre-Wave Devices
Author :
Walters, Peter C. ; Pollard, Roger D. ; Richardson, John R. ; Gamand, Patrice M. ; Suchet, Philippe R.
Author_Institution :
Dept. of Electronic and Electrical Engineering, Microwave Solid State Group, The University of Leeds, ENGLAND
Abstract :
The purpose of this paper is to identify the differences between millimetre-wave small-signal scattering parameter device measurements on-wafer in coplanar and microstrip test formats. Calibration in coplanar and microstrip is examined to determine the measurement reference planes and possible calibration problems in the millimetre-wave frequency range. Different device model reference planes are considered.
Keywords :
Automatic control; Automatic testing; Calibration; Electromagnetic measurements; Electromagnetic modeling; Microstrip; Microwave devices; Microwave measurements; Parameter extraction; Probes;
Conference_Titel :
ARFTG Conference Digest-Fall, 40th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1992.326996
