Temperature dependence of complex permittivity for polyimide film used in flexible printed circuit in microwave band

Author

Tsuchiya, A. ; Sugama, H. ; Hidaka, N. ; Miyamoto, K. ; Tsujino, S. ; Hashimoto, O.

Author_Institution

Kanagawa Ind. Technol. Center, Ebina, Japan

fYear

2011

fDate

12-16 Sept. 2011

Firstpage

417

Lastpage

420

Abstract

Temperature dependence of the complex permittivity for polyimide (PI) used in flexible printed circuit at 10 GHz was measured by cylindrical cavity resonator method with temperature controller in temperature range between 27 to 100°C. The complex permittivity of PI absorbing moisture was larger than those of PI drying at 27°C. With an increase in temperature, the complex permittivity of PI absorbing moisture decreased and came close to those of PI drying over 70°C. The complex permittivity of PI in low temperature is affected by moisture absorption compared to high temperature. From measurement result, we discussed the effect of temperature and moisture condition on dielectric loss of microstrip line fabricated on PI.

Keywords

cavity resonators; dielectric losses; dielectric materials; dielectric thin films; flexible electronics; microstrip lines; permittivity; polymer films; printed circuits; cylindrical cavity resonator; dielectric loss; flexible printed circuit; frequency 10 GHz; microstrip line; moisture absorption; polyimide film; temperature 100 degC to 27 degC; temperature dependent complex permittivity; Dielectric losses; Moisture; Permittivity; Permittivity measurement; Temperature dependence; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetics in Advanced Applications (ICEAA), 2011 International Conference on

Conference_Location

Torino

Print_ISBN

978-1-61284-976-8

Type

conf

DOI

10.1109/ICEAA.2011.6046375

Filename

6046375