Title :
SEE and TID results for a commercially fabricated radiation hardened field programmable gate array
Author :
Hafer, C. ; Lake, R. ; Jordan, A. ; Farris, T.
Author_Institution :
Aeroflex Colorado Springs, CO, USA
Abstract :
Aeroflex´s RadHard-by-Design commercially fabricated field programmable gate array provides a radiation hardened quick-turn solution to aerospace IC users. Characterization results for single event upset, single event latchup and total ionizing dose are presented.
Keywords :
field programmable gate arrays; integrated circuit testing; ion beam effects; radiation hardening (electronics); FPGA; SEE; TID; aerospace IC; field programmable gate array; ion beam; radiation hardened FPGA; single event latchup; single event upset; total ionizing dose; Circuit testing; Clocks; Cyclotrons; Field programmable gate arrays; Integrated circuit testing; Logic; Radiation hardening; Semiconductor device testing; Shift registers; Single event upset;
Conference_Titel :
Radiation Effects Data Workshop, 2004 IEEE
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-8697-3
DOI :
10.1109/REDW.2004.1352910
