Title :
Frequency and Time Domain Characterization of High-Speed Digital Circuit Interconnects in a Multilayer Printed Circuit Board
Author :
Agrawal, Amit P.
Author_Institution :
IBM, 1701 North Street, Endicott, NY-13760
Abstract :
The digital interconnects are characterized in frequency domain by measuring the scattering matrices using network analyser. These scattering matrices are used to find frequency dependent resistance, inductance, capacitance, and conductance of the coupled transmission lines. In time domain, the lossy transmission line parameters are used to simulate the transient response to analyse the skin-effect and dielectric loss effect on the signal propagation and cross-talk.
Keywords :
Dielectric losses; Digital circuits; Distributed parameter circuits; Frequency domain analysis; Integrated circuit interconnections; Nonhomogeneous media; Printed circuits; Propagation losses; Scattering; Transmission line matrix methods;
Conference_Titel :
ARFTG Conference Digest-Fall, 40th
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1992.327006
